Takano WM-7S Unpatterned Wafer Surface Inspection Tool

• 405 nm Laser Source
• Particle Detection Down to 79 nm 
• Configured for 200mm Wafers
• Manufactured in 2023
• Unused Since Installation/Qualification  

KLA-TENCOR Puma 9130 Darkfield Inspection Tool

• Parts Tool
• Please Inquire for Additional Details

KLA-TENCOR Puma 9120 IS Darkfield Inspection Tool

• For 200mm or 300mm Wafers
• 2ea Cameras
• Please Inquire for Additional Details

Tencor Surfscan 5500 Unpatterned Wafer Surface Inspection Tool

TENCOR Surfscan 4500 Unpatterned Wafer Surface Inspection Tool

• Cassette to Cassette Handling of 3” – 6” Wafers
• New HeNe 2mW Laser, 632.8 nm Wavelength
• New HeNe Laser Power Supply
• 2 µ Particle Size Sensitivity
• Automatic Calibration
• Flatscreen Monitor
• System Calibrated & Demonstrated
• Calibration Standard Wafer Included